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IEEE Electronic System Test Workshop
November 10-11, 2005
Austin Convention Center, Austin, TX, USA
In conjunction with the International Test Conference

http://testlab.ics.uci.edu/estw/
CALL FOR PARTICIPATION

Overview
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The objective of the Electronic Systems Test Workshop (ESTW) is to bring together researchers in all of the fields related to the test of entire systems. The heterogeneous nature of electronic system design necessitates the integration of different research communities to address the system test problem. Currently research in each related field is performed by largely distinct research communities including digital IC test, mixed-signal test, embedded system test, hardware/software coverification, and software test. As a result, there has been little effort towards the development of a coherent science of system test. This workshop will act as a forum for the broad collaboration required to establish a research foundation for the field of system test.

Program Highlights:

  • Ben Bennetts - Bennetts Associates
    "Objectives and status of the System JTAG (SJTAG) initiative"
  • Dave Bonnett - ASSET InterTech, Inc
    "System Test in AdvancedTCA"
  • Pai Chou - EECS Dept. UC Irvine
    "Scriptable Systems: Towards Interactive Testing during Programming of Distributed Embedded Systems"
  • Oussama Laouamri - INPG, University of Grenoble, LCIS laboratory
    "A Monitoring and Testing Architecture for System-on-Chips using Network Management Framework"
  • Laurent Lemarchand - Universite de Bretagne Occidentale
    "Maintenance Testing of Mixed-Signal Boards"
  • David Williams - Dell Computers
    "A vision for system test"
  • Eddie Kingston - EMC
    "Leveraging business models for systems test"
  • Ching-Bih Liaw - Sun Microsystems
    "In-System debug of CPU, or perceived CPU, issues using Sun's high end system"
  • A series of talks on Functional Verification of Systems
  • Panel discussion on System Test Research Goals

General Chair: Tony Ambler - University of Texas Austin
Program Chair: Ian G. Harris - University of California Irvine

For more information see the web page http://testlab.ics.uci.edu/estw/
For more information, visit us on the web at: http://testlab.ics.uci.edu/estw/

The IEEE Electronic System Test Workshop is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society– Test Technology Technical Council

TTTC CHAIR
André IVANOV
University of British Columbia– Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

SENIOR PAST CHAIR
Yervant ZORIAN
Virage Logic– USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com


TTTC 2ND VICE CHAIR
Michel RENOVELL
LIRMM– France
Tel. +33 467 418 523
E-mail renovell@lirmm.fr

FINANCE CHAIR
Adit D. SINGH
Auburn University– USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

IEEE DESIGN & TEST EIC
Rajesh K. GUPTA
University of California, Irvine– USA
Tel. +1-949-824-8052
E-mail gupta@uci.edu

TECHNICAL MEETINGS
Cheng-Wen WU
National Tsing Hua Univ.– Taiwan
Tel. +886-3-573-1154
E-mail cww@computer.org

TECHNICAL ACTIVITIES
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica– Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

ASIA & SOUTH PACIFIC
Hideo FUJIWARA
Nara Inst. of Science and Technology– Japan
Tel. +81-74-372-5220
E-mail fujiwara@is.aist-nara.ac.jp

LATIN AMERICA
Marcelo LUBASZEWSKI
Federal Univ. of Rio Grande do Sul (UFRGS)– Brazil
Tel. +34-93-401-6603
E-mail luba@vortex.ufrgs.br

NORTH AMERICA
William R. MANN
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Adit D. SINGH
Auburn University– USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic, Inc.– USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

  

PAST CHAIR
Paolo PRINETTO
Politecnico di Torino– Italy
Tel. +39-011-564-7007
E-mail Paolo.Prinetto@polito.it

TTTC 1ST VICE CHAIR
Adit D. SINGH
Auburn University– USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

SECRETARY
Christian LANDRAULT
LIRMM– France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

ITC GENERAL CHAIR
Rob AITKEN
Artisan Components– USA
Tel. +1-408-548-3297
E-mail aitken@artisan.com

TEST WEEK COORDINATOR
Yervant ZORIAN
Virage Logic, Inc.– USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS
Univ. of Piraeus– Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR
Synopsys– USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Joan FIGUERAS
Univ. Politècnica de Catalunya– Spain
Tel. +55-51-228-1633, Ext. 4830
E-mail figueras@eel.upc.es

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut– Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
Michael NICOLAIDIS
iRoC Technologies– Greece
Tel. +33-4-381-20763
E-mail michael.nicolaidis@iroctech.com

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino– Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it

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